The SL1000 is a modular data acquisition system that delivers independent, isolated channel hardware at high speeds up to 100 MSamples per channel, with no compromise in bit resolution, memory depth, or data streaming performance. Choose from a wide variety of I/O modules for electrical and physical sensor signal measurements to meet the needs of any high channel count application.
Selecting a data acquisition platform for electronics or mechatronics applications has always been a balancing act. High speed digitizers lack the isolation, attenuation, or bit resolution necessary for power electronics testing. PC-based platforms with fast streaming throughput sacrifice noise immunity, signal conditioning, and hardware integrity.
Until now. The new Yokogawa SL1000 is the only data acquisition system that delivers independent, isolated channel hardware at 100MS/ch rates, with no compromise in bit resolution, memory depth, or streaming performance.
Speed of managing and acquiring data is the highlight of the SL1000.
- Fast Acquisition
- Up to 100 MS/s on all channels (10 ns sampling interval)
- 100 MS/s 12-Bit 1 kV¹ isolation module with 20 MHz bandwidth
- Supports parallel testing: Perform measurements with up to four simultaneously independent sample rates
- Fast Transfer and Storage
- Stream data to PC via high speed USB 2.0 or 1000BASE-T Gigabit Ethernet²
- Real time display on a PC (GIGAZoom engine)³
- Stream data to a PC hard disk or the SL1000’s internal hard disk² in real time (at speeds of 1.6 MS/s = 100 kS/s x 16ch)³
- Easy to use
- Easy to use Standard Acquisition Software
- Quick and Intuitive operation means that you can start measuring immediately
- Setup Wizard guides you through detailed settings
- Can operate “Standalone”
- Store data directly on the SL1000
- Wide Library of Plug-In Modules
- Eight module slots are available in each unit
- Select from twelve different plug-in modules
¹: In combination with 10:1 probe (for isolated BNC input) model 702902 or 700929
²: Optional
³: Speed depends on PC performance and measuring conditions.