Source and measure, all in one unit
Before semiconductor devices and other electronic components can undergo commercial deployment, they must be characterized under a variety of environmental and functional testing to ensure conformity to specifications. Traditional benchtop testing involving a pair of digital multimeters and power supplies is often cost-prohibitive and time-consuming. A standalone, highly accurate, and highly functional device would be best suited to handle these applications. The source measure unit (SMU) provides:
Integration
- SMU’s combine the functionality of several devices including digital multimeters, power supplies, current sources, ohmmeters, and function generators into a compact, standalone device
- Can be used as a storage device for data recording and transferring or as part of a larger test system
Accuracy
- Source and measure hundreds of volts to all the way down to the microamp range, without losing resolution or speed
Functionality
- Seven modes of operation for any situation including VS/IM, VS/VM, IS/VM, IS/IM, VS, IS, and VS/IM or IS/VM*
- Special software for performing I/V curve tracing
- A host of specialized functions for semiconductor testing including built-in and custom sweeps, ramps, and pwm.
*
1. VS = Sourced Voltage
2. IM= Measured Current
3. IS= Sourced Current
4. VM = Measured Voltage
GS820 Multi Channel Source Measure Unit
Yokogawa source measure unit GS820 Precision SMU quick response for automated testing High-speed communication improves productivity Customizable to enable any test
GS200 DC Voltage / Current Source
The GS200 is a low voltage/current DC source with high accuracy, high stability, and high resolution.
GS610 Source Measure Unit
The GS610 is made up of a programmable current and voltage source, a voltmeter, and an ammeter. Each function can be combined into numerous operation modes.